200 Packaging and Assembly Equipment

Plating; Electro Chemical Plating for device assembly

202 Other Equipment

Heating; Annealing; Curing Equipment - Furnaces; Conveyors; Ovens; Test Chambers; Heat Treating

Space simulation; Vacuum chambers

Vacuum drying & out gassing Systems

203 Inspection & Measurement Products

Defect; Particle; Bump; Contamination Detection

Review or Inspection

Flat; Notch Finding System

Microscopes: Optical Microscopes

Thermal Sensing

Measurement

Analysis

Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation

205 Nanotechnology Equipment and Tools

Equipment

Nanotechnology Tools

207 Process Equipment

Cleaning; Washing; Drying Equipment for Substrate

Fab Processing

Coat; Develop; Resist Processing; Track Equipment

Deposition; Chemical Vapor (CVD); MOCVD; PECVD; LPCVD; ALD; REALD; MVD

Deposition; Physical Vapor (PVD); Sputtering; Evaporation Equipment

Etching; Stripping; Ashing - Dry and Wet Equipment

Ion; E-Beam Milling Etching Equipment

Plating; Electro Chemical Plating; Deposition Systems

Thermal Processing - Diffusion; Oxidation; Annealing; RTA; RTP Equipment

Transfer Systems for Wafer; Reticles or FPD's

208 Test Equipment

Test Contactor Cleaning; Conditioning Systems

304 Mask Making Materials

Mask and Reticle Handling Products

309 Test Materials

Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)

Test Sockets; Contactors and Contact accessories

400 Co

203 Inspection & Measurement Products

Microscopes: Atomic Force Microscopes (AFM)

205 Nanotechnology Equipment and Tools

Equipment

Nanotechnology Tools

901 Printed

Organic

Flexible and Large Area

Device Manufacturing: Integrated systems

401 Sub-systems

Pumps

Vacuum

200 Packaging and Assembly Equipment

Die Bonding; Attach Equipment

Die Removal Equipment

Dispensing Systems

Lithography Systems for Wafer Level Packaging; Bumping; 3D Interconnect Aligners

Printed and Organic Electronic Equipment

Wafer Level Bonders

203 Inspection & Measurement Products

Leak Detection Systems - Vacuum or Gas

Microscopes: Atomic Force Microscopes (AFM)

Microscopes: SEM; Focused Ion Beam (FIB)

TEM

Spectrometers; FTIR; ATR-FTIR; Auger Electron (AES); SIMS

X-ray; XRF; 3-D X-Ray; LEXES Systems

204 MEMS Equipment

Double sided mask aligner

207 Process Equipment

Cleaning; Washing; Drying Equipment for Substrate

Fab Processing

Coat; Develop; Resist Processing; Track Equipment

Lithography; Exposure; Aligners; Direct Write Systems; Steppers; Scanners; Nanoimprint

601 Design Software

CAD - Computer Automated Design

EDA - Electronic Design Automation; Circuit Design